Please use this identifier to cite or link to this item:
http://doi.org/10.25358/openscience-575
Authors: | Heyne, L. Kläui, Mathias Rhensius, J. Le Guyader, Loïc Nolting, Frithjof |
Title: | In situ contacting and current-injection into samples in photoemission electron microscopes |
Online publication date: | 7-Mar-2017 |
Year of first publication: | 2010 |
Language: | english |
DDC: | 530 Physik 530 Physics |
Institution: | Johannes Gutenberg-Universität Mainz |
Department: | FB 08 Physik, Mathematik u. Informatik |
Place: | Mainz |
ROR: | https://ror.org/023b0x485 |
DOI: | http://doi.org/10.25358/openscience-575 |
URN: | urn:nbn:de:hebis:77-publ-563015 |
Version: | Accepted version |
Publication type: | Zeitschriftenaufsatz |
License: | In Copyright |
Information on rights of use: | https://rightsstatements.org/vocab/InC/1.0/ |
Journal: | Review of scientific instruments 81 11 |
Pages or article number: | 113707-1 113707-5 |
Publisher: | AIP |
Publisher place: | Melville, NY |
Issue date: | 2010 |
ISSN: | 1089-7623 0034-6748 |
Publisher URL: | http://dx.doi.org/10.1063/1.3495967 |
Publisher DOI: | 10.1063/1.3495967 |
Appears in collections: | JGU-Publikationen |