In situ contacting and current-injection into samples in photoemission electron microscopes

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dc.contributor.authorHeyne, L.
dc.contributor.authorKläui, Mathias
dc.contributor.authorRhensius, J.
dc.contributor.authorLe Guyader, Loïc
dc.contributor.authorNolting, Frithjof
dc.date.accessioned2017-03-07T11:25:06Z
dc.date.available2017-03-07T12:25:06Z
dc.date.issued2010
dc.identifier.doihttp://doi.org/10.25358/openscience-575
dc.identifier.urihttps://openscience.ub.uni-mainz.de/handle/20.500.12030/577
dc.identifier.urnurn:nbn:de:hebis:77-publ-563015
dc.language.isoeng
dc.rightsInC-1.0de_DE
dc.rights.urihttps://rightsstatements.org/vocab/InC/1.0/
dc.subject.ddc530 Physikde_DE
dc.subject.ddc530 Physicsen_GB
dc.titleIn situ contacting and current-injection into samples in photoemission electron microscopesen_GB
dc.typeZeitschriftenaufsatzde_DE
jgu.journal.issue11
jgu.journal.titleReview of scientific instruments
jgu.journal.volume81
jgu.organisation.departmentFB 08 Physik, Mathematik u. Informatik
jgu.organisation.nameJohannes Gutenberg-Universität Mainz
jgu.organisation.number7940
jgu.organisation.placeMainz
jgu.organisation.rorhttps://ror.org/023b0x485
jgu.pages.end113707-5
jgu.pages.start113707-1
jgu.publisher.doi10.1063/1.3495967
jgu.publisher.issn1089-7623
jgu.publisher.issn0034-6748
jgu.publisher.nameAIP
jgu.publisher.placeMelville, NY
jgu.publisher.urihttp://dx.doi.org/10.1063/1.3495967
jgu.publisher.year2010
jgu.rights.accessrightsopenAccess
jgu.subject.ddccode530
jgu.type.dinitypeArticle
jgu.type.resourceText
jgu.type.versionAccepted versionen_GB
opus.date.accessioned2017-03-07T11:25:06Z
opus.date.available2017-03-07T12:25:06
opus.date.modified2017-05-16T08:29:07Z
opus.identifier.opusid56301
opus.institute.number0801
opus.metadataonlyfalse
opus.organisation.stringFB 08: Physik, Mathematik und Informatik: Institut für Physikde_DE
opus.subject.dfgcode00-000
opus.type.contenttypeKeinede_DE
opus.type.contenttypeNoneen_GB

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