Please use this identifier to cite or link to this item: http://doi.org/10.25358/openscience-5271
Authors: Ross, Andrew
Lebrun, Romain
Ulloa, Camilo
Grave, Daniel A.
Kay, Asaf
Baldrati, Lorenzo
Kronast, Florian
Valencia, Sergio
Rothschild, Avner
Kläui, Mathias
Title: Structural sensitivity of the spin Hall magnetoresistance in antiferromagnetic thin films
Online publication date: 24-Nov-2020
Language: english
Abstract: Reading the magnetic state of antiferromagnetic (AFM) thin films is key for AFM spintronic devices. We investigate the underlying physics behind the spin Hall magnetoresistance (SMR) of bilayers of platinum and insulating AFM hematite (alpha-Fe2O3) and find an SMR efficiency of up to 0.1%, comparable to ferromagnetic-based structures. To understand the observed complex SMR field dependence, we analyze the effect of misalignments of the magnetic axis that arise during growth of thin films, by electrical measurements and direct magnetic imaging, and find that a small deviation can result in significant signatures in the SMR response. This highlights the care that must be taken when interpreting SMR measurements on AFM spin textures.
DDC: 530 Physik
530 Physics
Institution: Johannes Gutenberg-Universität Mainz
Department: FB 08 Physik, Mathematik u. Informatik
Place: Mainz
DOI: http://doi.org/10.25358/openscience-5271
Version: Accepted version
Publication type: Zeitschriftenaufsatz
Document type specification: Scientific article
License: in Copyright
Information on rights of use: https://rightsstatements.org/page/InC/1.0/?language=en
Journal: Physical review : B
102
9
Pages or article number: Art. 094415
Publisher: APS
Publisher place: College Park, Md.
Issue date: 2020
ISSN: 2469-9969
2469-9950
Publisher's URL: https://doi.org/10.1103/PhysRevB.102.094415
Appears in collections:JGU-Publikationen

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