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Authors: Conca Parra, Andrés
Casper, Frederick
Paul, Johannes
Lehndorff, Ronald
Haupt, Christian
Jakob, Gerhard
Kläui, Mathias
Hillebrands, Burkard
Title: Microstructure design for fast lifetime measurements of magnetic tunneling junctions
Online publication date: 4-Sep-2019
Year of first publication: 2019
Language: english
Abstract: The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consuming and prevents a continuous observation of the production. Here, we present a novel microstructure design for a parallel measurement of the lifetime characteristics of a sensor population. By making use of two alternative designs and the Weibull statistical distribution function, we are able to measure the lifetime characteristics of a CoFeB/MgO/CoFeB tunneling junction population. The main parameters governing the time evolution of the failure rate are estimated and discussed and the suitability of the microstructure for highly reliable sensor application is proven.
DDC: 530 Physik
530 Physics
Institution: Johannes Gutenberg-Universität Mainz
Department: FB 08 Physik, Mathematik u. Informatik
Place: Mainz
URN: urn:nbn:de:hebis:77-publ-592266
Version: Accepted version
Publication type: Zeitschriftenaufsatz
License: In Copyright
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Journal: Sensors
Pages or article number: Art. 583
Publisher: MDPI
Publisher place: Basel
Issue date: 2019
ISSN: 1424-8220
Publisher URL:
Publisher DOI: 10.3390/s19030583
Appears in collections:JGU-Publikationen

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