Please use this identifier to cite or link to this item:
http://doi.org/10.25358/openscience-202
Authors: | Dong, Bo-Wen Baldrati, Lorenzo Schneider, Christoph Niizeki, Tomohiko Ramos, Rafael Ross, Andrew Cramer, Joel Saitoh, Eiji Kläui, Mathias |
Title: | Antiferromagnetic NiO thickness dependent sign of the spin Hall magnetoresistance in gamma-Fe2O3/NiO/Pt epitaxial stacks |
Online publication date: | 20-Aug-2019 |
Year of first publication: | 2019 |
Language: | english |
Abstract: | We study the spin Hall magnetoresistance (SMR) in epitaxial γ–Fe2O3/NiO(001)/Pt stacks, as a function of temperature and thickness of the antiferromagnetic insulating NiO layer. Upon increasing the thickness of NiO from 0 nm to 10 nm, we detect a sign change of the SMR in the temperature range between 10 K and 280 K. This temperature dependence of the SMR in our stacks is different compared to that of previously studied yttrium iron garnet/NiO/Pt, as we do not find any peak or sign change as a function of temperature. We explain our data by a combination of spin current reflection from both the NiO/Pt and γ-Fe2O3/NiO interfaces and the thickness-dependent exchange coupling mode between the NiO and γ-Fe2O3 layers, comprising parallel alignment for thin NiO and perpendicular alignment for thick NiO. |
DDC: | 530 Physik 530 Physics |
Institution: | Johannes Gutenberg-Universität Mainz |
Department: | FB 08 Physik, Mathematik u. Informatik |
Place: | Mainz |
ROR: | https://ror.org/023b0x485 |
DOI: | http://doi.org/10.25358/openscience-202 |
URN: | urn:nbn:de:hebis:77-publ-591981 |
Version: | Accepted version |
Publication type: | Zeitschriftenaufsatz |
License: | In Copyright |
Information on rights of use: | https://rightsstatements.org/vocab/InC/1.0/ |
Journal: | Applied physics letters 114 10 |
Pages or article number: | Art. 102405 |
Publisher: | American Inst. of Physics |
Publisher place: | Melville, NY |
Issue date: | 2019 |
ISSN: | 1077-3118 0003-6951 |
Publisher URL: | http://dx.doi.org/10.1063/1.5080766 |
Publisher DOI: | 10.1063/1.5080766 |
Appears in collections: | JGU-Publikationen |