Please use this identifier to cite or link to this item:
Authors: Lidig, Christian
Minár, Jan
Braun, Jürgen
Ebert, Hubert
Gloskovskii, Andrei
Krieger, Jonas A.
Strocov, Vladimir
Kläui, Mathias
Jourdan, Martin
Title: Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Online publication date: 20-Aug-2019
Language: english
Abstract: Heusler compounds are promising materials for spintronics with adjustable electronic properties including 100% spin polarization at the Fermi energy. We investigate the electronic states of AlOx capped epitaxial thin films of the ferromagnetic half-metal Co2MnSi ex situ by soft x-ray angular resolved photoemission spectroscopy (SX-ARPES). Good agreement between the experimental SX-ARPES results and photoemission calculations including surface effects was obtained. In particular, we observed in line with our calculations a large photoemission intensity at the center of the Brillouin zone, which does not originate from bulk states, but from a surface resonance. This provides strong evidence for the validity of the previously proposed model based on this resonance, which was applied to explain the huge spin polarization of Co2MnSi observed by angular-integrating UV-photoemission spectroscopy.
DDC: 530 Physik
530 Physics
Institution: Johannes Gutenberg-Universität Mainz
Department: FB 08 Physik, Mathematik u. Informatik
Place: Mainz
URN: urn:nbn:de:hebis:77-publ-591915
Version: Accepted version
Publication type: Zeitschriftenaufsatz
License: in Copyright
Information on rights of use:
Journal: Physical review : B
Pages or article number: Art. 174432
Publisher: APS
Publisher place: College Park, Md.
Issue date: 2019
ISSN: 2469-9950
Publisher URL:
Publisher DOI: 10.1103/PhysRevB.99.174432
Appears in collections:JGU-Publikationen

Files in This Item:
  File Description SizeFormat
59191.pdf514.3 kBAdobe PDFView/Open