Ultra-fast true random number generator based on Ill-posedness nucleation of skyrmion bags in ferrimagnets

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dc.contributor.authorZhang, Zhizhong
dc.contributor.authorLin, Kelian
dc.contributor.authorZhang, Kun
dc.contributor.authorFeng, Xueqiang
dc.contributor.authorChen, Lei
dc.contributor.authorZhang, Youguang
dc.contributor.authorBournel, Arnaud
dc.contributor.authorKläui, Mathias
dc.contributor.authorZhao, Weisheng
dc.contributor.authorZhang, Yue
dc.date.accessioned2024-08-29T09:07:36Z
dc.date.available2024-08-29T09:07:36Z
dc.date.issued2024
dc.date.updated2024-08-26T12:22:54Z
dc.identifier.doihttp://doi.org/10.25358/openscience-10630
dc.identifier.urihttps://openscience.ub.uni-mainz.de/handle/20.500.12030/10648
dc.language.isoengde
dc.rightsInC-1.0*
dc.rights.urihttps://rightsstatements.org/vocab/InC/1.0/*
dc.subject.ddc530 Physikde_DE
dc.subject.ddc530 Physicsen_GB
dc.titleUltra-fast true random number generator based on Ill-posedness nucleation of skyrmion bags in ferrimagnetsen_GB
dc.typeZeitschriftenaufsatzde
elements.object.id171795
elements.object.labelsMicromagnetics
elements.object.labelsSpintronics
elements.object.labelsMathematical models
elements.object.labelsMagnetic tunneling
elements.object.labelsPerformance evaluation
elements.object.labelsGenerators
elements.object.labelsMagnetic moments
elements.object.labelsFerrimagnets
elements.object.labelstrue random number generator
elements.object.labelshigh-topological charge
elements.object.labelsskyrmion-bags
elements.object.labels0906 Electrical and Electronic Engineering
elements.object.labelsApplied Physics
elements.object.labels4009 Electronics, sensors and digital hardware
elements.object.typejournal-article
jgu.journal.issue5de
jgu.journal.titleIEEE electron device lettersde
jgu.journal.volume45de
jgu.organisation.departmentFB 08 Physik, Mathematik u. Informatikde
jgu.organisation.nameJohannes Gutenberg-Universität Mainz
jgu.organisation.number7940
jgu.organisation.placeMainz
jgu.organisation.rorhttps://ror.org/023b0x485
jgu.pages.end920de
jgu.pages.start917de
jgu.publisher.doi10.1109/LED.2024.3368210de
jgu.publisher.issn0741-3106de
jgu.publisher.nameIEEEde
jgu.publisher.placeNew York, NYde
jgu.publisher.urihttp://doi.org/10.1109/LED.2024.3368210de
jgu.publisher.year2024
jgu.rights.accessrightsopenAccess
jgu.subject.ddccode530de
jgu.type.dinitypeArticleen_GB
jgu.type.resourceTextde
jgu.type.versionAccepted versionde

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