Please use this identifier to cite or link to this item: http://doi.org/10.25358/openscience-7049
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dc.contributor.authorMedjanik, Katerina-
dc.contributor.authorBabenkov, Sergey-
dc.contributor.authorChernov, S.-
dc.contributor.authorVasilyev, Dmitry-
dc.contributor.authorSchönhense, B.-
dc.contributor.authorSchlueter, Christoph-
dc.contributor.authorGloskovskii, A.-
dc.contributor.authorMatveyev, Yu.-
dc.contributor.authorDrube, W.-
dc.contributor.authorElmers, Hans-Joachim-
dc.contributor.authorSchönhense, Gerd-
dc.date.accessioned2022-05-30T10:20:54Z-
dc.date.available2022-05-30T10:20:54Z-
dc.date.issued2019-
dc.identifier.urihttps://openscience.ub.uni-mainz.de/handle/20.500.12030/7063-
dc.description.abstractAn alternative approach to hard-X-ray photoelectron spectroscopy (HAXPES) has been established. The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope detects electrons with initial kinetic energies up to 8 keV with a k-resolution of 0.025 Å−1, equivalent to an angular resolution of 0.034°. A special objective lens with k-space acceptance up to 25 Å−1 allows for simultaneous full-field imaging of many Brillouin zones. Combined with time-of-flight (ToF) parallel energy recording this yields maximum parallelization. Thanks to the high brilliance (1013 hν s−1 in a spot of <20 µm diameter) of beamline P22 at PETRA III (Hamburg, Germany), the microscope set a benchmark in HAXPES recording speed, i.e. several million counts per second for core-level signals and one million for d-bands of transition metals. The concept of tomographic k-space mapping established using soft X-rays works equally well in the hard X-ray range. Sharp valence band k-patterns of Re, collected at an excitation energy of 6 keV, correspond to direct transitions to the 28th repeated Brillouin zone. Measured total energy resolutions (photon bandwidth plus ToF-resolution) are 62 meV and 180 meV FWHM at 5.977 keV for monochromator crystals Si(333) and Si(311) and 450 meV at 4.0 keV for Si(111). Hard X-ray photoelectron diffraction (hXPD) patterns with rich fine structure are recorded within minutes. The short photoelectron wavelength (10% of the interatomic distance) `amplifies' phase differences, making full-field hXPD a sensitive structural tool.en_GB
dc.language.isoengde
dc.rightsCC BY*
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/*
dc.subject.ddc530 Physikde_DE
dc.subject.ddc530 Physicsen_GB
dc.titleProgress in HAXPES performance combining full-field k-imaging with time-of-flight recordingen_GB
dc.typeZeitschriftenaufsatzde
dc.identifier.doihttp://doi.org/10.25358/openscience-7049-
jgu.type.dinitypearticleen_GB
jgu.type.versionPublished versionde
jgu.type.resourceTextde
jgu.organisation.departmentFB 08 Physik, Mathematik u. Informatikde
jgu.organisation.number7940-
jgu.organisation.nameJohannes Gutenberg-Universität Mainz-
jgu.rights.accessrightsopenAccess-
jgu.journal.titleJournal of synchrotron radiationde
jgu.journal.volume26de
jgu.journal.issue6de
jgu.pages.start1996de
jgu.pages.end2012de
jgu.publisher.year2019-
jgu.publisher.nameWiley-Blackwellde
jgu.publisher.placeChesterde
jgu.publisher.issn1600-5775de
jgu.organisation.placeMainz-
jgu.subject.ddccode530de
jgu.publisher.doi10.1107/S1600577519012773de
jgu.organisation.rorhttps://ror.org/023b0x485
Appears in collections:JGU-Publikationen

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