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http://doi.org/10.25358/openscience-7049
Autoren: | Medjanik, Katerina Babenkov, Sergey Chernov, S. Vasilyev, Dmitry Schönhense, B. Schlueter, Christoph Gloskovskii, A. Matveyev, Yu. Drube, W. Elmers, Hans-Joachim Schönhense, Gerd |
Titel: | Progress in HAXPES performance combining full-field k-imaging with time-of-flight recording |
Online-Publikationsdatum: | 30-Mai-2022 |
Erscheinungsdatum: | 2019 |
Sprache des Dokuments: | Englisch |
Zusammenfassung/Abstract: | An alternative approach to hard-X-ray photoelectron spectroscopy (HAXPES) has been established. The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope detects electrons with initial kinetic energies up to 8 keV with a k-resolution of 0.025 Å−1, equivalent to an angular resolution of 0.034°. A special objective lens with k-space acceptance up to 25 Å−1 allows for simultaneous full-field imaging of many Brillouin zones. Combined with time-of-flight (ToF) parallel energy recording this yields maximum parallelization. Thanks to the high brilliance (1013 hν s−1 in a spot of <20 µm diameter) of beamline P22 at PETRA III (Hamburg, Germany), the microscope set a benchmark in HAXPES recording speed, i.e. several million counts per second for core-level signals and one million for d-bands of transition metals. The concept of tomographic k-space mapping established using soft X-rays works equally well in the hard X-ray range. Sharp valence band k-patterns of Re, collected at an excitation energy of 6 keV, correspond to direct transitions to the 28th repeated Brillouin zone. Measured total energy resolutions (photon bandwidth plus ToF-resolution) are 62 meV and 180 meV FWHM at 5.977 keV for monochromator crystals Si(333) and Si(311) and 450 meV at 4.0 keV for Si(111). Hard X-ray photoelectron diffraction (hXPD) patterns with rich fine structure are recorded within minutes. The short photoelectron wavelength (10% of the interatomic distance) `amplifies' phase differences, making full-field hXPD a sensitive structural tool. |
DDC-Sachgruppe: | 530 Physik 530 Physics |
Veröffentlichende Institution: | Johannes Gutenberg-Universität Mainz |
Organisationseinheit: | FB 08 Physik, Mathematik u. Informatik |
Veröffentlichungsort: | Mainz |
ROR: | https://ror.org/023b0x485 |
DOI: | http://doi.org/10.25358/openscience-7049 |
Version: | Published version |
Publikationstyp: | Zeitschriftenaufsatz |
Nutzungsrechte: | CC BY |
Informationen zu den Nutzungsrechten: | https://creativecommons.org/licenses/by/4.0/ |
Zeitschrift: | Journal of synchrotron radiation 26 6 |
Seitenzahl oder Artikelnummer: | 1996 2012 |
Verlag: | Wiley-Blackwell |
Verlagsort: | Chester |
Erscheinungsdatum: | 2019 |
ISSN: | 1600-5775 |
DOI der Originalveröffentlichung: | 10.1107/S1600577519012773 |
Enthalten in den Sammlungen: | JGU-Publikationen |
Dateien zu dieser Ressource:
Datei | Beschreibung | Größe | Format | ||
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progress_in_haxpes_performanc-20220530120047835.pdf | 1.86 MB | Adobe PDF | Öffnen/Anzeigen |