Autoren:	Lidig, Christian Minár, Jan Braun, Jürgen Ebert, Hubert Gloskovskii, Andrei Krieger, Jonas A. Strocov, Vladimir Kläui, Mathias Jourdan, Martin
Titel:	Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Online-Publikationsdatum:	20-Aug-2019
Erscheinungsdatum:	2019
Sprache des Dokuments:	Englisch
Zusammenfassung/Abstract:	Heusler compounds are promising materials for spintronics with adjustable electronic properties including 100% spin polarization at the Fermi energy. We investigate the electronic states of AlOx capped epitaxial thin films of the ferromagnetic half-metal Co2MnSi ex situ by soft x-ray angular resolved photoemission spectroscopy (SX-ARPES). Good agreement between the experimental SX-ARPES results and photoemission calculations including surface effects was obtained. In particular, we observed in line with our calculations a large photoemission intensity at the center of the Brillouin zone, which does not originate from bulk states, but from a surface resonance. This provides strong evidence for the validity of the previously proposed model based on this resonance, which was applied to explain the huge spin polarization of Co2MnSi observed by angular-integrating UV-photoemission spectroscopy.
DDC-Sachgruppe:	530 Physik 530 Physics
Veröffentlichende Institution:	Johannes Gutenberg-Universität Mainz
Organisationseinheit:	FB 08 Physik, Mathematik u. Informatik
Veröffentlichungsort:	Mainz
ROR:	https://ror.org/023b0x485
DOI:	http://doi.org/10.25358/openscience-196
URN:	urn:nbn:de:hebis:77-publ-591915
Version:	Accepted version
Publikationstyp:	Zeitschriftenaufsatz
Nutzungsrechte:	Urheberrechtsschutz
Informationen zu den Nutzungsrechten:	https://rightsstatements.org/vocab/InC/1.0/
Zeitschrift:	Physical review : B 99 17
Seitenzahl oder Artikelnummer:	Art. 174432
Verlag:	APS
Verlagsort:	College Park, Md.
Erscheinungsdatum:	2019
ISSN:	2469-9950 1098-0121
URL der Originalveröffentlichung:	http://dx.doi.org/10.1103/PhysRevB.99.174432
DOI der Originalveröffentlichung:	10.1103/PhysRevB.99.174432
Enthalten in den Sammlungen:	JGU-Publikationen