On planar (110) channeling of 500 MeV positrons and electrons in silicon semiconductor detectors

dc.contributor.authorBacke, Hartmut
dc.date.accessioned2024-09-03T09:07:31Z
dc.date.available2024-09-03T09:07:31Z
dc.date.issued2024
dc.description.abstractThe investigation of the channeling phenomenon of positrons in single crystals relies on the availability of high quality positron beams. At the Mainz Microtron MAMI a facility is under construction which will supply a 500 MeV positron beam (Backe et al., 2022) with an emittance of = 0.055 mrad (1 ) in vertical direction. The beam line allows focusing of the positron beam in the target chamber with an angular spread of 64 rad (FWHM) at a beam width of 5 mm (FWHM). Employing a silicon detector oriented in (110) channeling conditions, it is intended to measure in a triple coincidence the energy loss of the positrons in the silicon detector, as proposed in a recent paper by Shchagin et al. (2022), the scattering angle and the energy of the emitted photons. In this paper a case study is presented with the aid of simulation calculations for such an experiment with special emphasis on the role of the plasmon resonances in silicon at 17 and 3.9 eV. Simulation results are presented for an electron beam of 500 MeV from MAMI as well.en_GB
dc.identifier.doihttp://doi.org/10.25358/openscience-10618
dc.identifier.urihttps://openscience.ub.uni-mainz.de/handle/20.500.12030/10636
dc.language.isoengde
dc.rightsCC-BY-4.0*
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/*
dc.subject.ddc530 Physikde_DE
dc.subject.ddc530 Physicsen_GB
dc.titleOn planar (110) channeling of 500 MeV positrons and electrons in silicon semiconductor detectorsen_GB
dc.typeZeitschriftenaufsatzde
jgu.journal.titleNuclear instruments & methods in physics research : Section Ade
jgu.journal.volume1059de
jgu.organisation.departmentFB 08 Physik, Mathematik u. Informatikde
jgu.organisation.nameJohannes Gutenberg-Universität Mainz
jgu.organisation.number7940
jgu.organisation.placeMainz
jgu.organisation.rorhttps://ror.org/023b0x485
jgu.pages.alternative168998de
jgu.publisher.doi10.1016/j.nima.2023.168998de
jgu.publisher.issn1872-9576de
jgu.publisher.nameElsevierde
jgu.publisher.placeAmsterdamde
jgu.publisher.year2024
jgu.rights.accessrightsopenAccess
jgu.subject.ddccode530de
jgu.subject.dfgNaturwissenschaftende
jgu.type.contenttypeScientific articlede
jgu.type.dinitypeArticleen_GB
jgu.type.resourceTextde
jgu.type.versionPublished versionde

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