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Results 31-40 of 45 (Search time: 0.033 seconds).
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PreviewIssue dateOnline publication dateTitleAuthor(s)
3331.pdf.jpg201317-Jan-2013Aufbau und Inbetriebnahme eines hochsensitiven 3-He-Magnetometers für ein zukünftiges Experiment zur Bestimmung eines elektrischen Dipolmoments des freien NeutronsKraft, Andreas
3333.pdf.jpg201321-Jan-2013Quantum Einstein gravity - advancements of heat kernel-based renormalization group studiesGroh, Kai
3358.pdf.jpg201326-Feb-2013Investigations on asymptotic safety of metric, tetrad and Einstein-Cartan gravityHarst, Ulrich
3361.pdf.jpg201322-Feb-2013Production of antihydrogen via double charge exchangeMüllers, Andreas
3616.pdf.jpg201323-Dec-2013Untersuchungen zur Strahldynamik am Harmonischen Doppelseitigen Mikrotron von MAMI-CDehn, Marco
werth_kai-packing_a_trun-20201014105145058.pdf.jpg20137-Oct-2020Packing a trunk : a physically based approach with full motional freedomWerth, Kai
nightshift__nmr_shift_inferen-20220913201246106.pdf.jpg201315-Sep-2022NightShift: NMR shift inference by general hybrid model training : a framework for NMR chemical shift predictionDehof, Anna Katharina; Loew, Simon; Lenhof, Hans-Peter; Hildebrandt, Andreas
56296.pdf.jpg20137-Mar-2017The effect of magnetic anisotropy on the spin configurations of patterned La0.7Sr0.3MnO3 elementsWohlhüter, Philip; Rhensius, Jan; Vaz, Carlos A. F.; Heidler, Jakoba; Körner, Helmut S.; Bisig, André; Foerster, Michael; Méchin, Laurence; Gaucher, Fabien; Locatelli, A.; Niño, Miguel A.; El Moussaoui, S.; Nolting, Frithjof; Goering, E.; Heyderman, Laura J.; Kläui, Mathias
56284.pdf.jpg20136-Mar-2017The effect of magnetocrystalline anisotropy on the domain structure of patterned Fe2CrSi Heusler alloy thin filmsMiyawaki, T.; Foerster, Michael; Finizio, Simone; Vaz, Carlos A. F.; Mawass, Mohamad-Assaad; Inagaki, K.; Fukatani, N.; Le Guyader, Loïc; Nolting, Frithjof; Ueda, K.; Asano, H.; Kläui, Mathias
56271.pdf.jpg20133-Mar-2017Magnetic domain structure of La0.7Sr0.3MnO3 thin-films probed at variable temperature with scanning electron microscopy with polarization analysisReeve, Robert M.; Mix, Christian; König, Markus; Foerster, Michael; Jakob, Gerhard; Kläui, Mathias

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