Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy

Lidig, ChristianMinár, JanBraun, JürgenEbert, HubertGloskovskii, AndreiKrieger, Jonas A.Strocov, VladimirKläui, MathiasJourdan, Martin2019-08-202019-08-202019https://openscience.ub.uni-mainz.de/handle/20.500.12030/198engInC-1.0https://rightsstatements.org/vocab/InC/1.0/530 Physik530 PhysicsSurface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopyZeitschriftenaufsatzurn:nbn:de:hebis:77-publ-591915