Depth profiling of oxygen migration in Ta/HfO2 stacks during ionic liquid gating - Bednarz, Beatrice; Wortmann, Martin; Kuschel, Olga; Kammerbauer, Fabian; Kläui, Mathias; Hütten, Andreas; Wollschläger, Joachim; Jakob, Gerhard; Kuschel, Timo (American Chemical Society (ACS), 2026)
Keywords: 530 Physik; 530 Physics