Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source - Schmitt, Matthias; Biswas, Deepnarayan; Tkach, Olena; Fedchenko, Olena; Liu, Jieyi; Elmers, Hans-Joachim; Claessen, Ralph; Lee, Tien-Lin; Schönhense, Gerd (Elsevier, 2025)
Keywords: 530 Physik; 530 Physics