Development of new atomic force microscopy methods to investigate interfaces of semiconductor materials

Weber, StefanSeiffert, SebastianTremel, WolfgangRohrbeck, Pascal Niko2025-08-072025-08-072025https://openscience.ub.uni-mainz.de/handle/20.500.12030/12753engCC-BY-4.0https://creativecommons.org/licenses/by/4.0/540 Chemie540 Chemistry and allied sciencesDevelopment of new atomic force microscopy methods to investigate interfaces of semiconductor materialsDissertationurn:nbn:de:hebis:77-4eac6e80-3aa8-4255-a640-51ad6d6107690X, 296 Seiten ; Illustrationen, Diagramme